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PFM-SMPL 80 N/m Resolution Qualification Structure – RQ04

SKU: 80960298622

4.1
EUR725.00 EUR766.00

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Description

Resolution Qualification Structure – RQ04

Combines a tip with 1 nm nominal end radius and moderate 0

The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip

Cylindrical flat punch

more consistent results

PFM-SMPL 80 N/m Resolution Qualification Structure – RQ04Periodically poled lithium niobate (PPLN), mounted onto 15mm steel puck DESCRIPTION Standard sample for Piezoresponse Force Microscopy. Square substrate of periodically poled lithium niobate mounted onto 15mm steel puck. Piezoelectric coefficient d33=7. 5 pm V, coercive field 2 x 107V m, surface polarization 0. 7 C m2(sq).

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