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25 N/m spring constant for reliable highest resolution imaging on any sample
Highly wear resistant
These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
5 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3
Highly sensitive nanoelectrical measurements
FIB6-400A 110 kHz 25 N/m spring constant for42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15: 1 at 6um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 7 Back Angle: 11 31 Side Angle: 1. 7 Tip Radius (Nom): 10
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