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Intended for checking light element analysis performance and contains CaB6
Nanomaterials Characterization Using the K-kit
Sapphire Sample
This reduces possible contamination
these probes provide consistent results over many dozens of images
TEM/FIB Grid Pin Stub, Quad Pin Mount SEM Specimen Holders Intended for checking light elementDESCRIPTION Accepts up to four standard 3mm TEM and FIB grids for easy inspection of film coverage and sample attachment by SEM. Diameter of holder is 18mm (0. 71"), pin length is 6mm (0. 24"). Prod # Description Unit 15493 TEM FIB Grid Pin Stub, Quad each
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